Rad-icon Imaging Corporation

Scientific Imaging
Diffraction and scattering of x-rays are widely used techniques in the analysis of materials ranging from metals and ceramics to organic crystals. Our standard sensors are optimized for the 10 kV to 30 kV energy range, but with special coatings and packaging they can be used to detect lower energy photons and even beta radiation. For example, a Beryllium window and a high-resolution GdOS scintillator can be used to enhance sensitivity in the 8-20 kV range. The bare detectors, of course, are sensitive to visible light with excellent QE throughout the entire visible spectrum.
Please click on an image below to see a full size version:

Diffraction image of Lysozyme molecule at 18keV.
(image courtesy Dr. Yagi - SPring8)

Small-angle diffraction and scattering (SAXS) image of chicken tendon.
(image courtesy Dr. Yagi - SPring8)

Wide-angle (WAXS) pattern taken with specially configured Shad-o-Box.
(image courtesy Dr. Yagi - SPring8)

Resolution chart.
(Nuc. Assoc. #07-539)

Image Unsharpness Gage (EN-462-5):
50µm Pt wires with 50µm space.
(Dr. Uwe Zscherpel - BAM Berlin)

Spectrum from Mo x-ray tube.
(image courtesy of NIST/NRL)